collapseos/tools/tests/unit/test_expr.asm

139 lines
1.8 KiB
NASM

.equ RAMSTART 0x4000
.equ ZASM_REG_MAXCNT 0xff
.equ ZASM_LREG_MAXCNT 0x40
.equ ZASM_REG_BUFSZ 0x1000
.equ ZASM_LREG_BUFSZ 0x200
jp test
#include "core.asm"
#include "parse.asm"
#include "lib/util.asm"
#include "zasm/util.asm"
#include "zasm/const.asm"
#include "lib/parse.asm"
#include "zasm/parse.asm"
.equ SYM_RAMSTART RAMSTART
#include "zasm/symbol.asm"
#include "zasm/expr.asm"
; Pretend that we aren't in first pass
zasmIsFirstPass:
jp unsetZ
zasmGetPC:
ret
testNum: .db 1
s1: .db "2+2", 0
s2: .db "0x4001+0x22", 0
s3: .db "FOO+BAR", 0
s4: .db "BAR*3", 0
s5: .db "FOO-3", 0
s6: .db "FOO+BAR*4", 0
sFOO: .db "FOO", 0
sBAR: .db "BAR", 0
test:
ld hl, 0xffff
ld sp, hl
ld hl, s1
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
or a
jp nz, fail
ld a, l
cp 4
jp nz, fail
call nexttest
ld hl, s2
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
cp 0x40
jp nz, fail
ld a, l
cp 0x23
jp nz, fail
call nexttest
; before the next test, let's set up FOO and BAR symbols
call symInit
ld hl, sFOO
ld de, 0x4000
call symRegisterGlobal
jp nz, fail
ld hl, sBAR
ld de, 0x20
call symRegisterGlobal
jp nz, fail
ld hl, s3
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
cp 0x40
jp nz, fail
ld a, l
cp 0x20
jp nz, fail
call nexttest
ld hl, s4
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
or a
jp nz, fail
ld a, l
cp 0x60
jp nz, fail
call nexttest
ld hl, s5
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
cp 0x3f
jp nz, fail
ld a, l
cp 0xfd
jp nz, fail
call nexttest
ld hl, s6
call parseExpr
jp nz, fail
push ix \ pop hl
ld a, h
cp 0x40
jp nz, fail
ld a, l
cp 0x80
jp nz, fail
call nexttest
; success
xor a
halt
nexttest:
ld a, (testNum)
inc a
ld (testNum), a
ret
fail:
ld a, (testNum)
halt